== Abstract ==

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We present a methodological approach for the validation of fault management systems for Advanced Driver Assistance Systems (ADAS). For the validation process the unique VEHIL facility, developed by TNO Automotive and currently situated in Helmond, The Netherlands, is applied. The VEHIL facility provides the opportunity to make the entire development process of intelligent vehicles safer, cheaper, and more manageable, and to make simulation more reliable. The main feature of VEHIL is that a complete intelligent vehicle, including its sensors and actuators, can be tested in a Hardware-In-the-Loop simulation environment. In this way VEHIL can be applied in the design phase for fast and easy optimization of the sensor configuration. Moreover, due to its ability for providing very accurately controllable testing conditions, VEHIL can also be used for the validation of the performance of intelligent vehicle control and fault management systems. In this paper, we particularly focus on the use of VEHIL for the validation of fault management systems for Advanced Driver Assistance Systems.

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== Original document ==

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The different versions of the original document can be found in:

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* [https://pure.tue.nl/ws/files/3455736/379848393573509.pdf https://pure.tue.nl/ws/files/3455736/379848393573509.pdf]

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* [https://research.tue.nl/nl/publications/vehil-a-test-facility-for-validation-of-fault-management-systems-for-advanced-driver-assistance-systems(0c8ee9f2-34ee-4547-8e06-f757b255d275).html https://research.tue.nl/nl/publications/vehil-a-test-facility-for-validation-of-fault-management-systems-for-advanced-driver-assistance-systems(0c8ee9f2-34ee-4547-8e06-f757b255d275).html]

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* [https://api.elsevier.com/content/article/PII:S1474667017303762?httpAccept=text/xml https://api.elsevier.com/content/article/PII:S1474667017303762?httpAccept=text/xml],

: [https://api.elsevier.com/content/article/PII:S1474667017303762?httpAccept=text/plain https://api.elsevier.com/content/article/PII:S1474667017303762?httpAccept=text/plain],

: [http://dx.doi.org/10.1016/s1474-6670(17)30376-2 http://dx.doi.org/10.1016/s1474-6670(17)30376-2] under the license https://www.elsevier.com/tdm/userlicense/1.0/

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* [https://www.sciencedirect.com/science/article/pii/S1474667017303762 https://www.sciencedirect.com/science/article/pii/S1474667017303762],

: [https://pure.tue.nl/ws/files/3455736/379848393573509.pdf https://pure.tue.nl/ws/files/3455736/379848393573509.pdf],

: [https://www.narcis.nl/publication/RecordID/oai%3Apure.tue.nl%3Apublications%2F0c8ee9f2-34ee-4547-8e06-f757b255d275 https://www.narcis.nl/publication/RecordID/oai%3Apure.tue.nl%3Apublications%2F0c8ee9f2-34ee-4547-8e06-f757b255d275],

: [https://research.tue.nl/en/publications/vehil-a-test-facility-for-validation-of-fault-management-systems- https://research.tue.nl/en/publications/vehil-a-test-facility-for-validation-of-fault-management-systems-],

: [https://research.tudelft.nl/en/publications/vehil-a-test-facility-for-validation-of-fault-management-systems- https://research.tudelft.nl/en/publications/vehil-a-test-facility-for-validation-of-fault-management-systems-],

: [https://academic.microsoft.com/#/detail/2157097613 https://academic.microsoft.com/#/detail/2157097613]

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