Ferroelectric ceramics are susceptible to fracture under high electric fields, which are commonly generated in the vicinity of electrodes or conducting layers. In the present work, we extend a phase-field model of fracture in ferroelectric single crystals to the simulation of the propagation of conducting cracks under purely electrical loading. This is done by introducing the electrical enthalpy of a diffuse conducting layer into the phase-field formulation. Simulation results show oblique crack propagation and crack branching from a conducting notch, forming a tree-like crack pattern in a ferroelectric sample under positive and negative electric fields. Microstructure evolution indicates the formation of tail-to-tail and head-to-head 90° domains, which results in charge accumulation around the crack. The charge accumulation, in turn, induces a high electric field and hence a high electrostatic energy, further driving the conducting crack. Salient features of the results are compared with experiments.

Full Document

The PDF file did not load properly or your web browser does not support viewing PDF files. Download directly to your device: Download PDF document
Back to Top

Document information

Published on 01/01/2013

DOI: 10.1016/j.actamat.2013.07.050
Licence: CC BY-NC-SA license

Document Score


Times cited: 9
Views 4
Recommendations 0

Share this document

claim authorship

Are you one of the authors of this document?