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The different versions of the original document can be found in:
 
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* [https://hal.inria.fr/hal-01385353/file/978-3-319-23868-5_12_Chapter.pdf https://hal.inria.fr/hal-01385353/file/978-3-319-23868-5_12_Chapter.pdf] under the license cc-by
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* [https://hal.inria.fr/hal-01385353/file/978-3-319-23868-5_12_Chapter.pdf https://hal.inria.fr/hal-01385353/file/978-3-319-23868-5_12_Chapter.pdf] under the license https://creativecommons.org/licenses/by
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* [http://link.springer.com/content/pdf/10.1007/978-3-319-23868-5_12 http://link.springer.com/content/pdf/10.1007/978-3-319-23868-5_12],
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: [http://dx.doi.org/10.1007/978-3-319-23868-5_12 http://dx.doi.org/10.1007/978-3-319-23868-5_12] under the license cc-by
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* [https://hal.inria.fr/hal-01385353 https://hal.inria.fr/hal-01385353],
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* [https://link.springer.com/chapter/10.1007%2F978-3-319-23868-5_12 https://link.springer.com/chapter/10.1007%2F978-3-319-23868-5_12],
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: [https://dblp.uni-trier.de/db/conf/ifip12/aiai2015.html#Merazi-MeksenBB15 https://dblp.uni-trier.de/db/conf/ifip12/aiai2015.html#Merazi-MeksenBB15],
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: [https://hal.inria.fr/IFIP-AICT-458/hal-01385353 https://hal.inria.fr/IFIP-AICT-458/hal-01385353],
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: [https://academic.microsoft.com/#/detail/2188179638 https://academic.microsoft.com/#/detail/2188179638] under the license http://creativecommons.org/licenses/by/

Revision as of 17:06, 21 January 2021

Abstract

Part 3: Data Representation and Analysis; International audience; Ultrasonic inspection is nowadays widely used in material inspection to detect and locate internal defects. However, in case of large structures inspection, such as pipelines, vessel reactors etc., the amount of signals to acquire and interpret may be very important, especially in modern techniques that use image representations.In this article, a proposed algorithm to ultrasonic data selection and processing is described. Images will be replaced by 2 arrays that contain only the data regarding a detected defect. This allows avoiding the storage of useless received ultrasonic data, and simple pattern recognition techniques may be exploited to defect characterization.

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Original document

The different versions of the original document can be found in:

http://dx.doi.org/10.1007/978-3-319-23868-5_12 under the license cc-by
https://hal.inria.fr/hal-01385353/document,
https://hal.inria.fr/hal-01385353/file/978-3-319-23868-5_12_Chapter.pdf under the license http://www.springer.com/tdm
https://dblp.uni-trier.de/db/conf/ifip12/aiai2015.html#Merazi-MeksenBB15,
https://hal.inria.fr/IFIP-AICT-458/hal-01385353,
https://academic.microsoft.com/#/detail/2188179638 under the license http://creativecommons.org/licenses/by/
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Published on 01/01/2015

Volume 2015, 2015
DOI: 10.1007/978-3-319-23868-5_12
Licence: CC BY-NC-SA license

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