Abstract

International audience; Burn-In (BI) test is usually applied in manufacturing process to screen out chip early life failures, especially for safety critical applications. Unfortunately, this test method has elevated costs for companies. In recent days, Faster-than-at-Speed-Test (FAST) [...]

Abstract

As it is widely known nonlinear dynamic analyses are mostly carried out in the time domain. In this paper an alternate procedure to carry out nonlinear computations in the frequency domain is proposed. This method is a powerful extension of the widely known equivalent nonlinear [...]