Scipediacontent: Scipediacontent moved page Review 503216762840 to Nassar et al 2026a

2026-01-23T12:38:20Z

Scipediacontent moved page Review 503216762840 to Nassar et al 2026a

JSanchez: JSanchez moved page Draft Sanchez Pinedo 841842100 to Review 503216762840

2026-01-23T10:18:59Z

JSanchez moved page Draft Sanchez Pinedo 841842100 to Review 503216762840

JSanchez: Created page with " == Abstract ==
The stress-strength reliability parameter is a key metric used in various fields, including engineering, medicine, and business. In engineering, it quantif..."

2026-01-23T10:18:53Z

Created page with " == Abstract == <p>The stress-strength reliability parameter is a key metric used in various fields, including engineering, medicine, and business. In engineering, it quantif..."

New page

== Abstract ==

<p>The stress-strength reliability parameter is a key metric used in various fields, including engineering, medicine, and business. In engineering, it quantifies the probability that a system’s strength X exceeds the applied stress Y . In this study, we examine for the first time four estimation approaches for evaluating the stress-strength reliability parameter R= P(Y < X ), where X and Y are independent Weibull random variables with different scale parameters but a common shape parameter. The analysis is conducted under a unified hybrid censoring scheme. From the classical perspective, we employ the maximum likelihood and maximum product of spacings methods to obtain both point and interval estimates. From the Bayesian perspective, two forms of the posterior distribution, based on the likelihood and spacings functions, are derived and analyzed using Markov Chain Monte Carlo sampling techniques. The Bayes estimates of R are obtained under the symmetric squared error loss, and the corresponding Bayesian credible intervals are also computed. To compare the four point estimators and the four interval estimators, an extensive simulation study is performed using various experimental scenarios. Finally, comprehensive analyses for organic white light-emitting diode datasets mixed with three colors, namely red, green, and blue, are provided.OPEN ACCESS Received: 29/06/2025 Accepted: 16/09/2025 Published: 23/01/2026</p>

== Document ==
<pdf>Media:Draft_Sanchez Pinedo_841842100-8066-document.pdf</pdf>

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Nassar et al 2026a - Revision history

Scipediacontent: Scipediacontent moved page Review 503216762840 to Nassar et al 2026a

JSanchez: JSanchez moved page Draft Sanchez Pinedo 841842100 to Review 503216762840

JSanchez: Created page with " == Abstract == The stress-strength reliability parameter is a key metric used in various fields, including engineering, medicine, and business. In engineering, it quantif..."

JSanchez: Created page with " == Abstract ==
The stress-strength reliability parameter is a key metric used in various fields, including engineering, medicine, and business. In engineering, it quantif..."