Scipediacontent: Scipediacontent moved page Draft Content 221539611 to Havlir Pan 2006a

2021-02-03T16:59:55Z

Scipediacontent moved page Draft Content 221539611 to Havlir Pan 2006a

Scipediacontent: Created page with " == Abstract == Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form model..."

2021-02-03T16:59:52Z

Created page with " == Abstract == Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form model..."

New page

== Abstract ==

Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form models to predict the delay distribution of an interconnect pipeline stage and the slew distributions of all the nets in the circuit. Also, a buffer sizing and re-placement algorithm is presented to minimize the area of interconnect pipelines while meeting the delay and slew constraints. Experiments show that ignoring location dependent variation can cause a timing yield loss of 8.8% in a delay limited circuit, and the area can be improved by over 10% when the location dependent variation and residual random variation are understood and separated. Furthermore, under equivalent area, an interconnect pipeline optimized with only sizing changes may violate the slew constraint on over 50% of the nets, so location change is needed to best optimize these circuits.

== Original document ==

The different versions of the original document can be found in:

* [http://www.cerc.utexas.edu/utda/publications/ahavlir-iconpipelineoptim.pdf http://www.cerc.utexas.edu/utda/publications/ahavlir-iconpipelineoptim.pdf]

* [http://xplorestaging.ieee.org/ielx5/10740/33864/01613132.pdf?arnumber=1613132 http://xplorestaging.ieee.org/ielx5/10740/33864/01613132.pdf?arnumber=1613132],
: [http://dx.doi.org/10.1109/isqed.2006.118 http://dx.doi.org/10.1109/isqed.2006.118]

* [https://dblp.uni-trier.de/db/conf/isqed/isqed2006.html#HavlirP06 https://dblp.uni-trier.de/db/conf/isqed/isqed2006.html#HavlirP06],
: [http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000001613132 http://yadda.icm.edu.pl/yadda/element/bwmeta1.element.ieee-000001613132],
: [https://www.cerc.utexas.edu/utda/publications/ahavlir-iconpipelineoptim.pdf https://www.cerc.utexas.edu/utda/publications/ahavlir-iconpipelineoptim.pdf],
: [https://dl.acm.org/citation.cfm?id=1126255.1126747 https://dl.acm.org/citation.cfm?id=1126255.1126747],
: [https://academic.microsoft.com/#/detail/2137424674 https://academic.microsoft.com/#/detail/2137424674]

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Havlir Pan 2006a - Revision history

Scipediacontent: Scipediacontent moved page Draft Content 221539611 to Havlir Pan 2006a

Scipediacontent: Created page with " == Abstract == Process variation has become a major concern in the design of many nanometer circuits, including interconnect pipelines. This paper develops closed-form model..."